Wide Baseline Feature Matching Using the Cross-Epipolar Ordering Constraint

TitleWide Baseline Feature Matching Using the Cross-Epipolar Ordering Constraint
Publication TypeConference Paper
Year of Publication2004
AuthorsLu, X, Manduchi, R
Conference NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition
PublisherIEEE Computer Society
Conference LocationLos Alamitos, CA, USA
URLhttp://users.soe.ucsc.edu/~manduchi/papers/Lu_X.pdf
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