%0 Conference Paper %B IEEE Computer Society Conference on Computer Vision and Pattern Recognition %D 2004 %T Wide Baseline Feature Matching Using the Cross-Epipolar Ordering Constraint %A Lu, Xiaoye %A Roberto Manduchi %B IEEE Computer Society Conference on Computer Vision and Pattern Recognition %I IEEE Computer Society %C Los Alamitos, CA, USA %V 1 %P 16-23 %U http://users.soe.ucsc.edu/~manduchi/papers/Lu_X.pdf